To the new horizon of test rate 20MHz.
It is flexible and supports the high value-added LSI development of the
I shorten the distance from the new idea of the visitor to the market.
■Test rate of 20MHz
■Up to 256 pin I/O
■Up to 8DUT simultaneous measurement. Furthermore, I contribute to shortening by the SPMU deployment at test time
■V800, V777, upward compatibility with V7100
|The number of the correspondence pins||Up to 256 pin I/O|
|The number of the simultaneous measurement devices||Eight (32 pin /DUT)|
|Test item||The function measurement, IDDQ measurement unit (option)|
The DC parametric measurement (a current applied voltage measures voltage amperometry to apply)
|Main body external form dimensions, weight||730W×813H×1010D (mm)・200kg|
|Test head external form dimensions, weight||495.2W×315.7H×720D (mm)・50kg|